Measurements Rate New SMT Low-Voltage JFETs Under Consistent Conditions - An Update Using Modern JFETs
In 2013, Dimitri Danyuk wrote an article that presented apples-to-apples test results for noise densities for several low-noise discrete, SMT, and n-JFETs. In this follow-up article, Danyuk brings us new measurements, updating his design note with measurements of JFET components that appeared more recently on the market. The tests used the same operating conditions so that designers can make a fair comparison for their applications. This article was originally published in audioXpress, December 2018.