Modern Op-Amp Distortion Tests: Part 2 — A Few More BJT Types and JFET Devices
Many new op-amp types have appeared in the last decade, and Douglas Self thought it was time to evaluate those for distortion performance. In Part 1 of his article, he measured BJT-input devices using a similar protocol for five different loads and testing for basic op-amp distortion in favorable circumstances. In this second article, the measurement of BJT types is concluded, and he moves the JFET types to the test bench.
