All items tagged with IEC 61967-3 (1)
Langer EMV-Technik ICS 105 IC Scanner Allows Measurements of Emission Sources from Integrated Circuits
March 31, 2015 by audioXpress Staff

Langer EMV-Technik ICS 105 IC Scanner Allows Measurements of Emission Sources from Integrated Circuits

Langer EMV-Technik GmbH new ICS 105 IC scanner with near-field probes allows measuring electric or magnetic near fields with surface scans above ICs according to IEC 61967-3, volume scans above ICs and pin scans. Emissions from an IC are measured whilst in operation.
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